rendered paste bodysmartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MP0804H
Serial Number: S042J10XB49033
Firmware Version: UE100-14
User Capacity: 80,060,424,192 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Sat Dec 9 21:54:07 2006 UTC
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 112) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (4800) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 80) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 3200
4 Start_Stop_Count 0x0032 098 098 000 Old_age Always - 2508
5 Reallocated_Sector_Ct 0x0033 099 099 011 Pre-fail Always - 3
7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 878447
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1374
191 G-Sense_Error_Rate 0x0012 092 092 000 Old_age Always - 90744
194 Temperature_Celsius 0x0022 115 067 000 Old_age Always - 41
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 6673370
196 Reallocated_Event_Count 0x0032 098 098 000 Old_age Always - 6
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0
201 Soft_Read_Error_Rate 0x0012 100 100 000 Old_age Always - 0
223 Load_Retry_Count 0x0012 092 092 000 Old_age Always - 8876
225 Load_Cycle_Count 0x0012 015 015 000 Old_age Always - 866619
255 Unknown_Attribute 0x000a 100 100 051 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 445 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 445 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 5f 42 12 e3 00 01:26:10.375 READ DMA
ca 00 28 2f fa 39 e4 00 01:26:10.375 WRITE DMA
ca 00 58 d7 75 86 e4 00 01:26:10.375 WRITE DMA
ca 00 08 c7 10 f8 e1 00 01:26:10.375 WRITE DMA
c8 00 01 83 84 f2 e5 00 01:26:10.375 READ DMA
Error 444 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 5f 42 12 e3 00 01:26:09.000 READ DMA
c8 00 01 00 00 00 e0 00 01:26:09.000 READ DMA
ca 00 80 57 75 86 e4 00 01:26:09.000 WRITE DMA
ca 00 08 df 00 00 e0 00 01:26:09.000 WRITE DMA
c8 00 01 00 00 00 e0 00 01:26:08.938 READ DMA
Error 443 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 5f 42 12 e3 00 01:26:07.625 READ DMA
c8 00 01 00 00 00 e0 00 01:26:07.625 READ DMA
ca 00 08 c7 a3 01 e0 00 01:26:07.625 WRITE DMA
Error 442 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 5f 42 12 e3 00 01:26:06.250 READ DMA
c8 00 08 4f 42 12 e3 00 01:26:06.250 READ DMA
c8 00 08 3f 42 12 e3 00 01:26:06.250 READ DMA
c8 00 08 57 c4 e9 e0 00 01:26:06.125 READ DMA
c8 00 08 47 c4 e9 e0 00 01:26:06.125 READ DMA
Error 441 occurred at disk power-on lifetime: 5853 hours (243 days + 21 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 5f 42 12 e3 Error: UNC 8 sectors at LBA = 0x0312425f = 51528287
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 08 5f 42 12 e3 00 01:23:10.625 READ DMA
c8 00 01 48 f9 b9 e4 00 01:23:10.625 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 00% 7317 51528287
# 2 Extended offline Completed: read failure 00% 7316 51528287
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.