rendered paste bodyroot@1[knoppix]# smartctl -t long /dev/hda -a
smartctl version 5.34 [i686-pc-linux-gnu] Copyright (C) 2002-5 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG SP2014N
Serial Number: S088J10Y916999
Firmware Version: VC100-33
User Capacity: 200,049,647,616 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a
Local Time is: Mon Nov 6 01:27:26 2006 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4891) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 81) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 253 100 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5504
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 519
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0
9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 54h+24m
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 002 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 351
190 Unknown_Attribute 0x0022 124 094 000 Old_age Always - 38
194 Temperature_Celsius 0x0022 124 094 000 Old_age Always - 38
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 2213
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 253 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 6527 hours (271 days + 23 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
02 51 00 00 00 00 a0 Error: TK0NF
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
10 00 00 00 00 00 a0 00 00:12:39.750 RECALIBRATE [OBS-4]
00 00 01 01 00 00 a0 00 00:12:39.625 NOP [Abort queued commands]
ff 00 00 01 01 00 a0 00 00:06:22.563 [VENDOR SPECIFIC]
b0 d9 01 01 4f c2 a0 00 00:06:15.875 SMART DISABLE OPERATIONS
b0 d5 01 01 4f c2 a0 00 00:06:15.813 SMART READ LOG
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
=== START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION ===
Sending command: "Execute SMART Extended self-test routine immediately in off-line mode".
Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful.
Testing has begun.
Please wait 81 minutes for test to complete.
Test will complete after Mon Nov 6 02:48:26 2006
Use smartctl -X to abort test.
root@1[knoppix]#