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#2065679 ·published 2011-05-20 13:15 UTC
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home# smartctl -a /dev/ad0
smartctl 5.40 2010-10-16 r3189 [FreeBSD 7.0-RELEASE i386] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     Fujitsu MPA..MPG series
Device Model:     FUJITSU MPG3204AT  E
Serial Number:    VH73T0B00GDE
Firmware Version: 80B5
User Capacity:    20,495,154,688 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   5
ATA Standard is:  ATA/ATAPI-5 T13 1321D revision 1
Local Time is:    Fri May 20 19:14:48 2011 YEKST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                 ( 240) seconds.
Offline data collection
capabilities:                    (0x1b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        No Selective Self-test supported.
SMART capabilities:            (0x0002) Does not save SMART data before
                                        entering power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        No General Purpose Logging support.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        (  27) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   001   032    Pre-fail  Always   In_the_past 4505
  2 Throughput_Performance  0x0005   100   100   020    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0007   094   090   025    Pre-fail  Always       -       2
  4 Start_Stop_Count        0x0012   096   096   016    Old_age   Always       -       2503
  5 Reallocated_Sector_Ct   0x0033   064   064   024    Pre-fail  Always       -       345
  7 Seek_Error_Rate         0x000b   100   100   020    Pre-fail  Always       -       1722
  8 Seek_Time_Performance   0x0005   100   100   019    Pre-fail  Offline      -       0
  9 Power_On_Seconds        0x0012   075   075   020    Old_age   Always       -       3879h+48m+12s
 10 Spin_Retry_Count        0x0013   100   100   020    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   083   083   020    Old_age   Always       -       2623
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       32
196 Reallocated_Event_Count 0x0033   064   064   024    Pre-fail  Always       -       248
197 Current_Pending_Sector  0x0010   100   030   020    Old_age   Offline      -       0
198 Offline_Uncorrectable   0x0010   053   053   020    Old_age   Offline      -       95
199 UDMA_CRC_Error_Count    0x000a   200   200   197    Old_age   Always       -       37
200 Multi_Zone_Error_Rate   0x000b   100   001   020    Pre-fail  Always   In_the_past 467

SMART Error Log Version: 1
ATA Error Count: 728 (device log contains only the most recent five errors)
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 728 occurred at disk power-on lifetime: 3880 hours (161 days + 16 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 71 00 db 24 71 e1  Device Fault; Error: IDNF at LBA = 0x017124db = 24192219

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 20 bf 37 6f e1 00      03:06:26.500  WRITE DMA

Error 727 occurred at disk power-on lifetime: 3880 hours (161 days + 16 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 71 18 4f 29 04 e0  Device Fault; Error: IDNF 24 sectors at LBA = 0x0004294f = 272719

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 18 4f 29 04 e0 00      03:04:00.700  READ DMA

Error 726 occurred at disk power-on lifetime: 3880 hours (161 days + 16 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 71 80 3f 31 5c e2  Device Fault; Error: IDNF 128 sectors at LBA = 0x025c313f = 39596351

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 80 3f 31 5c e2 00      03:03:01.900  READ DMA

Error 725 occurred at disk power-on lifetime: 3880 hours (161 days + 16 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 71 04 d3 2c 0c e0  Device Fault; Error: IDNF 4 sectors at LBA = 0x000c2cd3 = 797907

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 04 d3 2c 0c e0 00      03:02:59.000  READ DMA

Error 724 occurred at disk power-on lifetime: 3880 hours (161 days + 16 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 71 04 5b fb 6f e1  Device Fault; Error: IDNF 4 sectors at LBA = 0x016ffb5b = 24116059

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 04 5b fb 6f e1 00      03:02:58.500  READ DMA

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Device does not support Selective Self Tests/Logging
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