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smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce AllenHome page is http://smartmontools.sourceforge.net/=== START OF INFORMATION SECTION ===Model Family:     Hitachi Travelstar 80GN familyDevice Model:     IC25N020ATMR04-0Serial Number:    MRG157K1H3M1RHFirmware Version: MO1OAD0AUser Capacity:    20,003,880,960 bytesDevice is:        In smartctl database [for details use: -P show]ATA Version is:   6ATA Standard is:  ATA/ATAPI-6 T13 1410D revision 3aLocal Time is:    Sat Oct 16 22:17:46 2010 UTCSMART support is: Available - device has SMART capability.SMART support is: Enabled=== START OF READ SMART DATA SECTION ===SMART overall-health self-assessment test result: FAILED!Drive failure expected in less than 24 hours. SAVE ALL DATA.See vendor-specific Attribute list for failed Attributes.General SMART Values:Offline data collection status:  (0x82)	Offline data collection activity					was completed without error.					Auto Offline Data Collection: Enabled.Self-test execution status:      (   0)	The previous self-test routine completed					without error or no self-test has ever 					been run.Total time to complete Offline data collection: 		 ( 645) seconds.Offline data collectioncapabilities: 			 (0x5b) SMART execute Offline immediate.					Auto Offline data collection on/off support.					Suspend Offline collection upon new					command.					Offline surface scan supported.					Self-test supported.					No Conveyance Self-test supported.					Selective Self-test supported.SMART capabilities:            (0x0003)	Saves SMART data before entering					power-saving mode.					Supports SMART auto save timer.Error logging capability:        (0x01)	Error logging supported.					General Purpose Logging supported.Short self-test routine recommended polling time: 	 (   2) minutes.Extended self-test routinerecommended polling time: 	 (  21) minutes.SMART Attributes Data Structure revision number: 16Vendor Specific SMART Attributes with Thresholds:ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE  1 Raw_Read_Error_Rate     0x000b   100   100   062    Pre-fail  Always       -       0  2 Throughput_Performance  0x0005   105   105   040    Pre-fail  Offline      -       5863  3 Spin_Up_Time            0x0007   019   019   033    Pre-fail  Always   FAILING_NOW 1  4 Start_Stop_Count        0x0012   098   098   000    Old_age   Always       -       4075  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       0  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0  8 Seek_Time_Performance   0x0005   120   120   040    Pre-fail  Offline      -       36  9 Power_On_Hours          0x0012   039   039   000    Old_age   Always       -       27087 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0 12 Power_Cycle_Count       0x0032   098   098   000    Old_age   Always       -       3850191 G-Sense_Error_Rate      0x000a   100   100   000    Old_age   Always       -       65536192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       102193 Load_Cycle_Count        0x0012   038   038   000    Old_age   Always       -       626289194 Temperature_Celsius     0x0002   152   152   000    Old_age   Always       -       36 (8 238 255 254)196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       58197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0SMART Error Log Version: 1ATA Error Count: 2	CR = Command Register [HEX]	FR = Features Register [HEX]	SC = Sector Count Register [HEX]	SN = Sector Number Register [HEX]	CL = Cylinder Low Register [HEX]	CH = Cylinder High Register [HEX]	DH = Device/Head Register [HEX]	DC = Device Command Register [HEX]	ER = Error register [HEX]	ST = Status register [HEX]Powered_Up_Time is measured from power on, and printed asDDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,SS=sec, and sss=millisec. It "wraps" after 49.710 days.Error 2 occurred at disk power-on lifetime: 21339 hours (889 days + 3 hours)  When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were:  ER ST SC SN CL CH DH  -- -- -- -- -- -- --  10 51 01 80 29 54 e2  Error: IDNF 1 sectors at LBA = 0x02542980 = 39070080  Commands leading to the command that caused the error were:  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name  -- -- -- -- -- -- -- --  ----------------  --------------------  c8 00 01 80 29 54 e2 00      07:12:50.200  READ DMA  e7 00 00 00 00 00 a0 00      07:12:50.200  FLUSH CACHE  e7 00 00 00 00 00 a0 00      07:12:50.100  FLUSH CACHE  ca 00 08 47 00 5e e0 00      07:12:50.100  WRITE DMA  c8 00 08 bf ec 60 e0 00      07:12:49.700  READ DMAError 1 occurred at disk power-on lifetime: 18785 hours (782 days + 17 hours)  When the command that caused the error occurred, the device was active or idle.  After command completion occurred, registers were:  ER ST SC SN CL CH DH  -- -- -- -- -- -- --  10 51 01 80 29 54 e2  Error: IDNF 1 sectors at LBA = 0x02542980 = 39070080  Commands leading to the command that caused the error were:  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name  -- -- -- -- -- -- -- --  ----------------  --------------------  c8 00 01 80 29 54 e2 00      02:42:32.100  READ DMA  e7 00 00 00 00 00 a0 00      02:42:32.000  FLUSH CACHE  e7 00 00 00 00 00 a0 00      02:42:31.600  FLUSH CACHE  ca 00 08 47 00 5e e0 00      02:42:31.600  WRITE DMA  ca 00 08 4f d1 5e e0 00      02:42:31.600  WRITE DMASMART Self-test log structure revision number 1Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error# 1  Short offline       Completed without error       00%         0         -Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum.SMART Selective self-test log data structure revision number 1 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS    1        0        0  Not_testing    2        0        0  Not_testing    3        0        0  Not_testing    4        0        0  Not_testing    5        0        0  Not_testingSelective self-test flags (0x0):  After scanning selected spans, do NOT read-scan remainder of disk.If Selective self-test is pending on power-up, resume after 0 minute delay.