rendered paste bodyroot@galactica:/var/log# smartctl --all /dev/sde
smartctl version 5.38 [x86_64-unknown-linux-gnu] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: WDC WD3000HLFS-01G6U0
Serial Number: WD-WXL808031531
Firmware Version: 04.04V01
User Capacity: 300,069,052,416 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Sun May 31 16:14:46 2009 EDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4680) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 58) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0003 196 195 021 Pre-fail Always - 3175
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 53
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 3995
10 Spin_Retry_Count 0x0012 100 253 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 53
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 149
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 150
194 Temperature_Celsius 0x0022 122 112 000 Old_age Always - 25
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 3982 hours (165 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 34 cf f3 03
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ea 00 00 00 00 00 00 08 49d+17:02:41.152 FLUSH CACHE EXIT
61 08 00 bf ac ee 22 08 49d+17:02:41.152 WRITE FPDMA QUEUED
ea 00 00 00 00 00 00 08 49d+17:02:41.151 FLUSH CACHE EXIT
61 28 00 df 7c 77 11 08 49d+17:02:40.943 WRITE FPDMA QUEUED
61 08 00 6f 60 46 03 08 49d+17:02:40.942 WRITE FPDMA QUEUED
Error 2 occurred at disk power-on lifetime: 2787 hours (116 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 34 cf f3 03
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ea 00 00 00 00 00 00 08 49d+17:02:41.314 FLUSH CACHE EXIT
61 08 00 bf ac ee 22 08 49d+17:02:41.314 WRITE FPDMA QUEUED
ea 00 00 00 00 00 00 08 49d+17:02:41.313 FLUSH CACHE EXIT
61 08 00 f7 7c 77 11 08 49d+17:02:41.110 WRITE FPDMA QUEUED
60 08 00 f7 7c 77 11 08 49d+17:02:41.109 READ FPDMA QUEUED
Error 1 occurred at disk power-on lifetime: 1594 hours (66 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 34 cf f3 03
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
ea 00 00 00 00 00 00 08 49d+17:02:41.869 FLUSH CACHE EXIT
61 08 00 bf ac ee 22 08 49d+17:02:41.869 WRITE FPDMA QUEUED
ea 00 00 00 00 00 00 08 49d+17:02:41.868 FLUSH CACHE EXIT
ea 00 00 00 00 00 00 08 49d+17:02:40.195 FLUSH CACHE EXIT
61 08 00 bf ac ee 22 08 49d+17:02:40.195 WRITE FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.